Lorri Hunt, Denise Robitaille, and Craig Williams’s default image

By Lorri Hunt, Denise Robitaille, and Craig Williams

Editors note: The following is an excerpt of The Insiders’ Guide to ISO 9001:2008 , which was published November 1 by Paton Professional.

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By Jeffrey H. Eves and Tim Hack

The term “global” is ubiquitous in our daily lives. Like the economy, human rights, and peace, the environment is often discussed in global terms because that’s the only way to bring about profound change. Now, global warming--even though its full extent is unknown--has brought a sense of urgency to improving the environment.

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By Mary F. McDonald

 

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By Dirk Dusharme @ Quality Digest

The quality industry offers a number of terrific events during the course of the year, but none is more informative, entertaining, and intimate than the Coordinate Metrology Systems Conference. This year’s CMSC occurs in Charlotte, North Carolina, July 21 through July 25. As always, the event is packed with activity, including a bustling exhibition hall, unique off-site events (a tour of Richard Childress Racing is included this year), and white paper presentations demonstrating the latest advances in portable coordinate metrology.

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By Scott Paton

It's hard to imagine a place more magical than Walt Disney World. The central Florida theme park continues to thrill, delight and exceed its guests' expectations more than 25 years after its opening.

Walt Disney World's recent 25th anniversary celebration provided Quality Digest with a sneak peek behind the scenes. A peek that provided the answer to the secret of Disney's success--one that Disney is now willing to share with outsiders through its new Disney Institute.

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By Anne Willimann

 

L

et’s travel back in time to September 10, 2008, at 10:28 a.m. At that moment, CERN became known to the general public when the first beam was successfully steered around the world’s most powerful particle accelerator—the Large Hadron Collider (LHC). This historic event marked the beginning of a new era of scientific discovery.

Geraldine S. Cheok, Alan M. Lytle, and Kamel S. Saidi, Ph.D.’s default image

By Geraldine S. Cheok, Alan M. Lytle, and Kamel S. Saidi, Ph.D.

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By John Klustner

 

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By Charles Wells

Most in the electronic manufacturing services industry are acutely aware of the growing problem of counterfeit and substandard electronic components within the supply chain, as well as the headaches that they cause.

Although industry and governments are working diligently in addressing counterfeit abatement, you may already have one of the most useful tools in combating phony parts in place right on your production floor.