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By American Society for Quality

(ASQ: Milwaukee) -- In today’s challenging economy, providing quality service can be a major competitive advantage—but it can be difficult to define and measure. The American Society for ... [Read More]

Edmund Optics’s picture
By Edmund Optics

(Edmund Optics: Barrington, NJ) -- Edmund Optics (EO), a provider of optical components, recently announced that it greatly expanded its line of TECHSPEC imaging and machine vision lenses, adding ... [Read More]

GE Sensing and Inspection Technologies’s picture
By GE Sensing and Inspection Technologies

(GE Sensing & Inspection Technologies: Groby, England) -- The hand-held DPI 620 advanced multifunction calibrator from GE Sensing & Inspection Technologies now incorporates full HART ... [Read More]

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By ANAB

(ANAB: Milwaukee) -- Randy A. Dougherty, vice president of the ANSI-ASQ National Accreditation Board (ANAB), has been elected chair of the International Accreditation Forum (IAF), the world ... [Read More]

LaserLinc Inc.’s picture
By LaserLinc Inc.

(LaserLinc: Fairborn, OH) -- LaserLinc Inc., a manufacturer of noncontact, precision measurement systems, announces the release of a new laser scan micrometer, the ... [Read More]

Camstar Systems Inc.’s picture
By Camstar Systems Inc.

(Camstar Systems Inc.: Charlotte, NC) -- Camstar offers “The Next Generation CAPA System” again by popular demand. Quality issues that are resolved through processes in a corrective and ... [Read More]

Zemetrics’s picture
By Zemetrics

(Zemetrics: Tucson, AZ) -- Zemetrics, maker of innovation-driven surface metrology products, introduces ZeScope, a subnanometer precision 3-D optical profilometer for general and industrial ... [Read More]

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By Master Control

(MasterControl: Salt Lake City) -- MasterControl, a global provider of software solutions that enable regulated companies to improve internal efficiency and reduce overall costs while accelerating ... [Read More]

Mettler-Toledo Inc.’s picture
By Mettler-Toledo Inc.

(Mettler-Toledo Inc.: Columbus, OH) -- Mettler Toledo introduces a line of ultramicrobalances and microbalances to the current Excellence Plus and Excellence lines of analytical balances. The XP6U ... [Read More]

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By Dimensional Metrology Standards Consortium

(DMIS: Arlington, TX) -- A new interoperability standard for dimensional metrology was approved by the ANSI as an American National Standard on Aug. 4. Through the auspices of the Dimensional ... [Read More]

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Quality Information