Inside Metrology

  |  10/16/2009

International Test Conference Approaching

TestWeek: Nov. 2-6; Exhibits and Conference: Nov. 3-5.

(ITC: New York) -- Register for the International Test Conference and make your online hotel reservations. Test Week events will be held Nov. 1-6, 2009, at the Austin Convention Center in Austin, Texas.

Mark your calendar and plan to join us at ITC Test Week 2009 as we celebrate our 40th conference year. View the Advance Program to find out more about the exciting technical program, exhibits, and commemorative events taking place at ITC 2009.

International Test Conference, the cornerstone of TestWeek events, is the world's premier conference dedicated to the electronic test of devices, boards, and systems, covering the complete cycle from design verification, test, diagnosis, failure analysis, and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

TestWeek's comprehensive program includes papers, panels, lectures, and advanced industrial practice sessions, tutorials, workshops, and the return of the famed poster session followed by a Texas-style beer blast. In addition to focused papers on hot topics such as test compression, power-aware test, advances in delay test, and silicon debug, new this year are four embedded tutorials on topics including testing of 3-D chips, new boundary-scan standards and post-silicon validation. Also new is a special Career Track hosted by IEEE-USA.

TTTC workshops, too
Three TTTC sponsored workshops are being held in parallel immediately following ITC 2009 at the Austin Convention Center:

 

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