Welcome to the second issue of CMSC World—the place to catch up on the latest happenings in portable 3-D metrology and imaging. This is the official newsletter of the Coordinate Metrology Society, and once again we are gearing up for our Coordinate Metrology Systems Conference—“the” conference to see and learn about the latest applications in the high-precision, mobile metrology industry.

Expert white paper presentations are the heart of our conference, and your participation is requested. Perhaps you are working, or have been involved, in a successful metrology project. Has 3-D metrology solved a problem for you? Have you been you involved with a process improved by the integration of 3-D metrology—for automated inspection cells, assembly cells, machining, or manufacturing process improvement? Perhaps you have discovered a new application or issue to solve. These end-user stories define the core of CMSC and are of great interest to the members of our society.

With only 11 days left before the March 3, 2008 deadline, I invite you to submit an abstract to be considered for a presentation at the 2008 CMSC. Guidelines can be found on our web site at www.cmsc.org/index.php?option=com_content&task=view&id=56&Itemid=79. Selected authors are awarded a free weekly conference registration, and will have the opportunity to be selected for publication in The Journal of the CMSC, a semiannual publication with a peer circulation of more than 18,000 quality professionals.

The Coordinate Metrology Systems Conference will be held July 21-25, 2008 in Concord, North Carolina, at the Embassy Suites Charlotte-Concord/Golf Resort & Spa. The hotel is located across the street from Lowe’s Motor Speedway in the heart of NASCAR Country.

For more information on giving a presentation at the 2008 CMSC, contact Talion Edwards, CMSC Technical Presentations Coordinator at 314-477-6231, or via e-mail at presentations@cmsc.org. Visit www.cmsc.org for detailed information about CMSC abstract and technical presentation requirements.

Don’t miss this opportunity to become a published author—submit an abstract for CMSC 2008!